www.yihu.com:英文版报告格式 CS Stage reliability test report_图文

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SHENZHEN ACT INDUSTRIAL CO.,LTD

Product reliability test report
Product category:MID Product models:D7 PCBA versions:/ Customer:Mai Di jie Product phases:CS Test quantity:5PCS Test date:2012-10-15 Electronics engineer:/ Structural engineer:/ Experimental project:HaiBenQiang Verifier: Test result: OK LiDongYue NG Reference

Condition OK

SHENZHEN ACT INDUSTRIAL CO.,LTD

Each experiment report records
NO。 1 2 3 4 5 6 7 8 9 10 11 12

Test item
Low temperature operation High temperature operation Low temperature no operation Temperature shock Bare-metal vibration Headset insert & pullout Hot operation Low temperature Cold boot TF card insert & pullout Repeat free fall ESD Key press life test

Test result
OK

Remark

OK OK OK OK OK
OK

OK
OK OK OK OK

1. Low temperature operation
·Test purpose:Verify product in the environment of low temperature, appearance and electrical properties
conform to specified requirements· Test condition: Samples without packaging placed in a temperature of -10 °C ± 2 °C, the duration of 8 hours, samples operation condition (Turn off the switch contain automatic shutdown or energy-saving ), all of the options in the most unfavorable state (if backlight products will Backlight placed normally open ,output signal output will be placed max). ·Test equipment: Humidity Chamber ·Test pic:

第 2 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD

·Judgement standard: Electrical performance, appearance and structure all ok ·Judgement ·Test data:
NO. 1# 2# 3# 4# 5# Appearance & structure OK OK OK OK OK Electrical performance OK OK OK OK OK Process mode / / / / / Verify effect / / / / /

result: OK■ NG□ Reference□

remark

Test person:HaiBenqiang 2012-10-15 2.Hot temperature storage
·Test purpose:Used to test not cooling products at high temperature adaptability · Test condition: The samples include packaging, temperature: 60 ° Humidity: 80% , Time:8H, C; temperature changes 2H, Return to original temperature after placed above 2H

·Test device: Humidity Chamber ·Test pic:

第 3 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD
·Judgement standard: Electrical performance, appearance and structure all ok ·Judgement result: OK■ NG□ Reference□ ·Test data:

NO. 1# 2# 3# 4# 5#

Appearance & structure OK OK OK OK OK

Electrical performance OK OK OK OK OK

Process mode / / / / /

Verify effect / / / / /

Remark

Test person:HaiBenqiang 2012-10-16 3.Low temperature storage
·test purpose:Used to test not cooling products at high temperature adaptability ·Test condition: The samples include packaging, temperature: -25℃ Time:8H, temperature changes 2H, ; Return to original temperature after placed above 3H ·Test Device: Humidity Chamber ·Test pic:

第 4 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD

·Judgement standard: Electrical performance, appearance and structure all ok ·Judgement result: OK■ NG□ Reference□ ·Test data:

NO. 1# 2# 3# 4# 5#

Appearance & structure OK OK OK OK OK

Electrical performance OK OK OK OK OK

Process mode / / / / /

Verify effect / / / / /

Remark

Test person:HaiBenqiang 2012-10-17 4. Temperature shock
·Test quantity:5PCS ·test purpose:Used to test not cooling products at high temperature adaptability ·Test condition: The samples power off, lay aside Humidity Chamber ,setup temperature: +70℃ ,low
第 5 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD
temperature -30℃ each temperature continue storage 1H, temperature changes below at 5minutes ,test ; 8 cycles, after test finish return to original temperature placed above 2H,inspection function、appearance ·Test Device: Cold&Hot shock temperature Chamber ·Test pic

·Judgement standard: Electrical performance, appearance and structure all ok ·Judgement result: OK■ NG□ Reference□ ·Test data:
NO. 1# 2# 3# 4# 5# Appearance & structure OK OK OK OK OK Electrical performance OK OK OK OK OK Process mode / / / / / Verify effect / / / / /

Remark

Test person:HaiBenqiang 2012-10-17

第 6 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD
5. Bare-metal vibration test
·Test propose:Used to determine the product reliability and product performance and ability to meet the requirements in the case of vibration;

· Test condition: Number of test samples:1pcs · Samples condition: package, not power off, Screen up; frequency:10HZ--55HZ amplitude: 0.75MM;
Conversion cycle :1Minute,total45 cycle。

·Test Device: Vibration tester
·Test pic

·Judgement standard: Product of the function should be ok,Between the assembly of

the cover is ok,No significant friction marks and scratch。 ·Judgement result: OK■ NG□ Reference□
Electrical performance OK
OK

·Test data: NO. Appearance & structure OK 1#
2# OK

Process mode
/ /

Verify effect
/ /

remark

Test person:HaiBenqiang 2012-10-21

第 7 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD

6. Charger and headphone insert & pullout life test
·Test quantity:2pcs

·Test propose:Detection product appearance, durability and electrical performance; · Test condition: a)charger insert & pull out: Insert the charger for mobile phone charge (1 boot, 1 shutdown), until the normal mobile phone charging state pull out charger, total of 5000 cycle; Headphone insert & pullout test: At Boot state , repeated insert and pull out headphones 5000 times, each time after insert at least keep 2 seconds; ·Test Device: manual work ·Judgement standard: Every 500 times a function and structure inspection, charging and headset functionality should be normal, I/O joint and welding surface no damage and loose, After Insert no loose phenomenon (insert after at least able to withstand the weight of the phone itself)

·Test pic:

·Judgement result: OK■ NG□ Reference□
·Test data: Appearance & structure OK OK Electrical performance OK OK Process mode / / Verify effect / /

NO. 4# 5#

Test person:HaiBenqiang 2012-10-22

第 8 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD

7. Hot operation
·Test propose:Verify that product in high temperature environment, appearance and electrical properties
conform to specified requirements

·Test condition: Samples excluding packaging placed in temperature 45 ℃ ± 2 ℃, relative humidity
80% - 2% (sample surface not have dew), duration eight hours, main engine work status (Turn off the switch contain automatic shutdown or energy-saving ), all options in the most unfavorable condition (such as a backlight products will be backlit in normally open, there is output signal products will be output in maximum)

·Test device: Constant temperature humidity chamber ·test pic:

·Judgement standard: Electrical performance, appearance and structure all ok

·Judgement result: OK■ NG□ Reference□
·Test data: NO. 1# 2# 3# 4# 5# Appearance & structure OK OK OK OK OK Electrical performance OK OK OK OK OK Process mode / / / / / Verify effect / / / / /

Remark

Test person:HaiBenqiang 2012-10-19

第 9 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD
8. Low temperature Cold boot
·Test propose:Validation products in low temperature environment, appearance and electrical properties
conform to specified requirements

·Test condition: Sample excluding packaging, shutdown state placed in temperature - 10 ℃ ± 2 ℃,
duration eight hours,Every 1 hour power on

·Test device: Constant temperature humidity chamber ·Test pic:

·Judgement standard: Electrical performance, appearance and structure all ok

·Judgement result: OK■ NG□ Reference□
·Test data: NO. Appearance & structure
1# 2# 3# 4# OK OK OK OK OK

5#

Electrical performance OK OK OK OK OK

Process mode
/ / / / /

Verify effect
/ / / / /

remark

Test person:HaiBenqiang 2012-10-20

第 10 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD
9.Test item:TF card insert & pullout test
·Test quantity:2pcs ·Test propose:The appearance of the detection products and electrical properties of durability ·Test condition: Insert memory card to remove and accumulated 1000 times. Support hot insert & pull out card must on state testing, each insert & pull out card 100 times once check, does not support hot insert & pull out card each insert & pull out card on 100 times once check. Requirements after test memory structure normal (not fracture), all mobile phone can be read card, the contents of the memory card must not be lost. Speed: 20 times/minutes. ·Test device: Manual work · Judgement standard: Memory card seat damage, resulting in not recognition memory card, for NG, Ignore
to take off the lacquer phenomenon, unless the paint off into pieces

·Judgement result: OK■ NG□ Reference□
·Test data: NO. Appearance & structure
1#

Electrical performance OK

Process mode /

Verify effect /

OK

2#

OK

OK

/

/

Test person:HaiBenqiang 2012-10-22

第 11 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD
10.Test item:Repeat free fall test
·Test quantity:2pcs ·Test propose:Verify phone drop impact resistance ability is accord with the request confirmation effect ·Test condition:Samples boot,from 7 cm high drop to covered by electrostatic mat desktop, total fall
100 times, every 10 times once checks.

·Judgement standard: Tests are not allowed to appear frequently power down (no more than 3 times),
no card read and function abnormal phenomena, the mobile phone structure should be no damage; After the test finish mobile phone can't have power down phenomenon.

·Test device: Manual work ·Judgement standard: Electrical performance, appearance and structure all ok

·Judgement result: OK■ NG□ Reference□
·Test data:
Test item NO. 3# 5#

appearance structure
OK OK

Electrical performance
OK OK

Processing mode

Results confirm

/ /

/ /

Test person:HaiBenqiang 2012-10-23

第 12 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD
11. ESD test

·Test propose:Used for testing the product in the electrostatic environment adaptability of work ·Test condition: A)he products are in power on working condition.
B)Air:±7KV/± 8KV, Test point for all plastic surface (inside metal parts), The I/O joint, buttons and Panel. Test a interval 1 SEC, each point ESD ten times. C)Contact:± 3KV/± 4KV, test point for all metal surface, the I/O joint (GND Area), vertical coupling plate (VCP), horizontal coupling plate (HCP) contact test; Test an interval 1 SEC, each point ESD ten times.

·Test device: Electrostatic generator ·Test pic:

·Judgement standard: AIR:±8KV;Contact:±4KV AIR:±7KV;Contact:±3KV

Do not have destructive phenomenon; Do not incorrect action phenomenon(For example: LCD flash system halted)

·Judgement result: OK■ NG□ Reference□ ·Test data:
Sample Numbers Position LCD around Horn Each key-press Non-contact testing Contact test

±7KV OK OK OK OK OK OK OK OK OK OK

±8KV OK OK OK OK OK OK OK OK OK OK

Position Power interface Metal back cover

±3KV OK OK

±4KV OK OK

1#

Earphone interface TF card interface LCD around Horn Each key-press

Power interface Metal back cover

OK OK

OK OK

3#

Earphone interface TF card interface

第 13 页 共 14 页

SHENZHEN ACT INDUSTRIAL CO.,LTD
LCD around Horn Each key-press

OK OK OK OK OK

OK OK OK OK OK

Power interface Metal back cover

OK OK

OK OK

5#

Earphone interface TF card interface

Test person:HaiBenqiang 2012-10-23 12 Key press life test
· Test sample quantity:2pcs · The test conditions and requirements:Test period main key for 300000 times, common key (side key) for 100000 times, speed of 60 times/minutes, pressure for 600-800 g, every 5000 times inspection function and appearance; ·Inspection standard:Test after completion of the elasticity of the key button should be good, the function should be normal. Test pic:

·Judgement result: OK■ NG□ Reference□ ·Test data::
NO. 2# 4# Appearance & structure OK OK Electrical performance OK OK Process mode / / Verify effect / /

remark

Test person:HaiBenqiang 2012-10-24

第 14 页 共 14 页


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Stage 2 Report 审核总结报告
材料试验报告Material test report
学霸百科